EGKWaferYieldAnalystAI

EGK Wafer Yield Analyst AI turns raw wafer bin-map data into visual, spatially-aware yield reports — powered by exact local computation and an on-device AI agent. No cloud, no data upload, no third-party servers. Every wafer map you import and every report generated is processed locally via Ollama, so proprietary yield data, defect signatures, and lot-level results never leave your device.

GETTING STARTED — ONE-TIME OLLAMA SETUP
AI narration runs through Ollama, a free local AI runtime. The app's built-in AI Setup tab walks you through it, or set it up manually with installation guide at AI Setup:
1. Download Ollama from ollama.com, install and launch it.
2. Pull a model (one-time): ollama pull llama3 (waits few minutes until you see the models Llama3 show up)
Return to AI Setup and tap Refresh. Wafer import, the visual die grid, and all exact yield statistics work immediately with no setup — only AI-narrated reports need Ollama running.

BUILT FOR YIELD & PROCESS ENGINEERS
Spotting whether a low-yielding wafer is an edge effect, a probe-card issue, or random contamination usually means staring at a bin map and doing mental math. This app does that math exactly, in-app, then lets an on-device AI narrate what it means and what to do about it — the natural companion to EGK TestScript AI Studio and EGK Test Report AI.

KEY FEATURES
- Import Wafer Maps — Bin-map CSVs (Die_X, Die_Y, Bin) with optional Lot ID, Wafer ID, and custom bin labels.
- Visual Wafer Map — Color-coded die grid inside a wafer outline, free to view, no subscription required.
- Exact Local Statistics — Overall, edge-ring vs. interior, and quadrant yield, plus worst row/column — computed precisely in-app. The AI never estimates a number, only interprets it.
- AI Yield Report — One click turns statistics into an executive summary, severity-triaged findings (Critical/Major/Minor/Info) with likely process causes, and a drafted lot disposition.
- Report History — Saved locally, browsable, one-click Markdown export.
- AI Setup — Guided Ollama setup with model selection and connection status.

FREE TO USE
Fully functional without a subscription. Free tier includes 3 AI report generations per day, reset daily.

EGK WAFER YIELD ANALYST PRO (OPTIONAL SUBSCRIPTION)
For engineers reviewing high volumes of lots, Pro removes the daily generation cap and supports larger on-device models for complex spatial analysis (on supported Apple Silicon).

Two auto-renewable plan options:
- EGK Wafer Yield Analyst Pro — Monthly
- EGK Wafer Yield Analyst Pro — Annual (discounted effective monthly rate)

Exact pricing for your region, subscription length, and title are shown in-app before purchase. Payment is charged to your Apple ID at confirmation of purchase. Subscriptions auto-renew unless auto-renew is turned off at least 24 hours before the end of the current period; your account is charged for renewal within 24 hours prior to that period's end, at the selected plan's price. Manage or cancel anytime in System Settings ▸ Apple ID ▸ Subscriptions. Any unused portion of a free trial, if offered, is forfeited upon purchase.

PRIVACY
All AI inference happens on-device through a local Ollama server. Imported wafer maps, computed statistics, generated reports, and report history are never sent to EGK's servers or any third party. Details: https://egkhor.com.my/privacy

Terms of Use (Apple Standard EULA) apply and are available at https://www.apple.com/legal/internet-services/itunes/dev/stdeula/ and mirrored at https://egkhor.com.my/terms — both reachable from Settings and the Pro screen at any time, no purchase required.